Structure-Property Relationship of CoFe2O4 Thin Films
Structure-Property Relationship of CoFe2O4
Thin
Films
Scientific
Achievement
Multiferroic
tunnel junctions consisting of a ferroelectric tunnel barrier
sandwiched
between two ferromagnetic electrodes, have aroused intense interest
because of
the interactions between the ferroelectric and ferromagnetic layers
that can
lead to new spin-dependent electron tunneling phenomena. In order to couple the
properties across the
interfaces, high quality epitaxial growth is required, while
maintaining good magnetotransport behavior.
We are addressing this by using metalorganic chemical
vapor deposition
(MOCVD) to grow suitable heterostructures, and using TEM and AFM to
study the
microstructure.
We
have grown CoFe2O4 (CFO)
thin films epitaxially on (001)
SrTiO3 despite the large lattice mismatch. Electron diffraction
patterns and HREM images
confirm that the epitaxial relationship is CFO(004)//STO(002)
and CFO<100>//STO<100>. The magnetic anisotropy
measured in the CFO
thin films can thus be ascribed to lattice strain.
The TEM bright field images and AFM
topography images show that the CFO films deposited at high temperature
(>600°C) have very rough surfaces (~22 nm) and a columnar
structure
resulting from an island growth mode (generally observed in MOCVD
growth). However,
for CFO films grown at lower
temperature (400-600°C), we observed that the surface roughness drops
two
orders of magnitude to 0.2 nm. This
suggests a change to a layer-by-layer growth mode, which occurs because
the
lower substrate temperature does not provide enough energy for the
precursors
to congregate to form large islands.
The
magnetic properties are relatively independent of deposition
temperature
although a rougher surface can result in pinning sites during the
magnetization
reversal process.
Significance
We
have shown that we can use MOCVD to grow epitaxial CFO thin films, and
that we
can control surface roughness without degrading magnetic properties
over a wide
range of deposition temperatures.
This
deposition temperature window will enable further development of
multiferroic
systems in the future, and also makes this potentially an
industry-compatible
and economical deposition technique.
In
the future, we will focus on fabricating multiferroic heterostructures
with CFO
as the ferromagnetic material and correlating the
magnetic/ferroelectric
properties with microstructure.
Performers
M. Pan
(Northwestern U.; Argonne-MSD); G. Bai, Yuzi Liu, A.
Petford-Long (Argonne-MSD); V. Dravid (Northwestern U.)

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