Characterizing High-performance Nanorod-array LEDs
Characterizing
High-performance Nanorod-array LEDs
Scientific
Achievement
The
InGaN materials systems provides a potential route to creating
effective LEDs
in the green range
of emission. Increased
InN incorporation should push the
wavelength up from the ~500 nm currently available. One of the road-blocks to
creating such a
device is the immiscibility of InN and GaN under standard conditions. In this work, InGaN is
grown through a porous
dielectric mask, creating an array of nanorods capped with hexagonal
pyramids. Strain
relief at the facets
and apex of these pyramids should allow for the incorporation of a
higher
concentration of InN. To
characterize
these structures, site specific analysis of the InN concentration is
necessary.
STEM-EDS
was utilized at the EMC to obtain profiles along the length of graded
nanorod-pyramid structures. The
presence
of InN was confirmed, along with a general trend of increasing indium
signal
along the length of the nanorod. The
characterization of the pyramid was limited by geometry and sample
preparation
issues, but did suggest a significant presence of InN.
Additionally, the STEM and EDS data
evidenced the inhomogeneity of the nanorod.
Significance
The
STEM and EDS data were able to confirm the presence of InN in the
nanorod and
pyramid caps, allowing the observed emission of these devices to be
correlated to
the nanorod-pyramid structures. The
results also indicated that more work on the graded growth is needed to
achieve a
continuous gradient. Furthermore,
sample preparation issues were
diagnosed in these experiments, in regards specifically to producing
FIB-liftout samples suitable for EDS analysis of InGaN.
Improved preparation methods have been
incorporated into current work, and EDS of future graded-InGaN
nanorod-pyramids
should be freer of artifacts and easier to analyze quantitatively.
Performers
R. Colby, P.
Deb, M. Oliver, D. N. Zakharov, I. H. Wildeson, D.
A. Ewoldt, Z. Liang, R. Edwin Garcia, E. A. Stach, T. D. Sands
(Purdue U.
and Birck Nanotechnology Center); N. J. Zaluzec (Argonne-MSD-EMC)

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