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Highlights

Examination of Buried Bonding Interfaces for Microsystem Applications

Examination of Buried Bonding Interfaces for Microsystem Applications

Scientific Achievement

Louisiana State University Department of Mechanical Engineering (LSU-ME) excels at micro/nano systems engineering. Fabrication and application of metal-based microdevices forms one part of the MEMS/NEMS R&D effort at LSU-ME. Technologies that can achieve easy, reliable, and high-strength bonding across microscale interfaces in metals are critical to assembly of metal-based microdevices. Al-based devices are important in different areas, for example, as microchannel heat exchangers for high heat flux removal applications.  Simultaneous bonding across numerous microscale interfaces is important for assembly of Al-based microdevices.  The work executed at Argonne's EMC during 2008, namely, structural and chemical examinations of buried Al-Al interfaces bonded with Al-Ge nanocomposite thin film intermediate layers, forms a critical part of our ongoing program in building metal-based microdevices.  Access to resources within Argonne's EMC, in particular, the focused ion beam (FIB) instrument, allowed buried bonding interfaces to be examined without mechanical contact, thereby ensuring reliability of results.  What is learned from FIB assisted bonding interface examinations is that the Al-Ge thin film intermediate layer assisted bonding process leads to the formation of an extended, ~100 micron wide, interface region, in which micro/nano scale Ge precipitates disperse randomly.  Such observations suggest that bonding mechanisms combine liquidus/solidus reactions with solid state diffusion, and that the extended interface region leads to increased bonding strength.

Significance

This work suggests metallurgical pathways to achieve high quality bonding across numerous microscale metal-metal interfaces.  The result of this work has been published in J. Mater. Res. 24, 544-555 (2009).  Follow-up research will include microscale bonding studies on different material systems, together with bonding mechanism investigations.  Reliable and economical microscale bonding technologies is a critical enabler for metal-based microdevices.  Future R&D will target high-impact applications and demonstrate the technical and economical feasibility of metal-based microdevices.

Performers

F. Mei, W. J.Meng (Louisiana State U. – ME); J. Hiller, D. J. Miller (Argonne-MSD)



 


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