TEM Study of Nanoscale Cu-Ni(100) Alloy Oxidation
TEM
Study of Nanoscale Cu-Ni(100) Alloy Oxidation
Scientific
Achievement
The metal-oxide interface formed
from the nanoscale
oxidation Cu-Ni(100) alloys has been investigated by transmission
electron
microscopy (TEM). NiO
islands with the
size of ~ 250nm are observed to form on the alloy surface. The epitaxial relationship
between the NiO islands
and the Cu-Ni(100) substrate is identified as NiO(111)//Cu-Ni(100) and
NiO( 11)//Cu-Ni(010). The
high resolution TEM images reveal that the metal substrate and the
oxide
islands do not form smooth interface and atomic steps with multiple
atomic
heights (from two to five atomic layers thick) are present at the
metal-oxide
interface. Dislocations
are observed to
form at the metal-oxide interface. No Cu oxide phase is observed. However, surprisingly, many small Cu particles
(the particle size
varies from 20 to 40 nm) are observed to form on the surface of NiO
islands.
Significance
The metal-oxide interface plays a
critical role in the
mass transport for oxide growth during metal oxidation, but many
fundamental
questions still remain unresolved regarding the exact atomic structures
at the
metal-oxide interface and their effect on the transport of atoms
between metal
substrate and the oxide phase. Some
models have been proposed for such atom transport processes. For example, Pieraggi and Rapp have proposed that the vacancies
that are injected
when the metal atoms diffuse into the oxide are annihilated by a
dislocation
climbing mechanism; however, it is still not verified
experimentally. Our
TEM observations of
the existence of dislocations at the metal-oxide interface from the
Cu-Ni
system provide the direct experimental evidence to support this
dislocation
climbing mechanism. The
formation of
nanosized Cu particles on the surface of the NiO islands is an
intriguing phenomenon
and this may be related to some previously-unnoticed physical processes.
Performers
G. W. Zhou, J.
A. Eastman, D. Fong (Argonne-MSD); L. Wang
(UIUC-MSE)

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