Resources

ACAT:  Argonne Chromatic Aberration-corrected TEM

A separate proposal is required to request access to ACAT.

This microscope, a FEI Titan 80-300 ST, is the EMC's high resolution imaging TEM. It has a CEOS Cc/Cs corrector on the imaging side of the column to correct both spherical and chromatic aberrations. The Cc/Cs corrector also provides users with greatly-improved resolution and signal for energy filtered imaging and EELS. It does not have a probe corrector for STEM.

The EMC continues to operate ACAT as a development platform for advanced microscopy. ACAT will provide a platform to pursue new concepts such as the possibility to use chromatic aberration for improved resolution in environmental in-situ experiments.

IVEM-Tandem Facility

A separate proposal is required to request access to the IVEM-Tandem Facility.

This unique facility consists of an intermediate voltage TEM (IVEM), a Hitachi H-9000NAR, interfaced to two ion accelerators.  This combination allows in situ observation of ion beam modification and effects of irradiation.  In addition, a number of holders allow a variety of in situ experiments to be performed, ranging from low temperature studies using a liquid He stage to studies at high temperatures with hot stages.  The ion beam accelerators can be used independently for ion beam irradiation/implantation and analysis for other research programs.

FEI Tecnai F20ST TEM/STEM

The Tecnai is the EMC's current premier analytical transmission electron microscope (AEM). Specialized accessories include an energy-dispersive x-ray spectrometer, a rotatable biprism for electron holography, and a post-column electron filter for both electron energy-loss spectroscopy (EELS) and energy-filtered imaging (EFI). The STEM capability enables HAADF imaging and XEDS/EELS spectrum imaging, among others. Specimen cooling and heating holders are also available.

Zeiss 1540XB FIB-SEM

The 1540XB is the EMC's platform for site-specific TEM sample preparation, 3D data acquisition, nanofabrication and manipulation, and other advanced uses.  Simultaneous electron and ion scanning offers unique imaging and fabrication opportunities.

FEI CM30T – analytical transmission electron microscope (AEM)

Hitachi S-4700-II – high resolution, high vacuum SEM

FEI Quanta 400F – high resolution environmental and variable-pressure SEM

Specimen Preparation
Specimen preparation is an important part of electron microscopy.  The EMC maintains an array of standard specimen preparation capabilities that are available to users.  While users are expected to carry out their own specimen preparation, expertise and guidance may be provided by EMC or other NST staff.

Image Analysis Laboratory
The EMC Imaging Laboratory provides resources for image processing and analysis.  The center includes computers and workstations with commercial software for image simulation, modeling, manipulation and analysis together with input and output devices for image handling.