IVEM - TANDEM
The IVEM-Tandem is a transmission electron microscope interfaced with two ion accelerators for in situ ion beam studies involving ion implementation and/or ion damage. In addition a variety of specimen holders allows in situ cooling and heating experiments (with or without ion irradiation) from 15-1200K, in situ experiments from 300-600K and electrical biasing experiments from 300-800K.
Intermediate Voltage Electron Microscope
Target Area
In situ ion beam and other experiments
Electron Microscopes are common now in universities, government labs and industry. The combination of microscopes with ion accelerators, however, involves considerable financial investment that most are not able to make. This facility provides an opportunity to do experiments that require this combination of equipment.
Using the IVEM-Tandem
All individuals desiring access to the EM Center’s IVEM-Tandem facility must first register with Argonnne National Laboratory’s National User Facilities On-Line Registration System and then submit a proposal. Proposals to use the IVEM are solicited on a regular basis and reviewed by the Steering Committee. If the proposal is approved, time on the IVEM will be assigned to the user. Use of the facility is usually free of charge.
Further information can be obtained from :
IVEM-Tandem Facility Coordinator
Materials Science Division Bldg. 212
Argonne National Laboratory
Argonne, Il 60439
ivem-tandem@anl.gov
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