Stephan Hruszkewycz

  • Assistant Physicist
  • Bldg. 223, A-209
  • Phone: 630-252-3214
  • This e-mail address is being protected from spambots. You need JavaScript enabled to view it.
 

 

Research Interests

My research focuses on using and developing scattering techniques in conjunction with computational tools to characterize nanoscale structure and dynamics in materials, most recently with coherent x-ray diffraction.

I am currently involved in developing hard x-ray Bragg ptychography techniques at the CNM/APS Nanoprobe beamline for imaging nano- and meso- scale structure in complex materials in working environments. I am also involved in the development and implementation of x-ray photon correlation spectroscopy at the Linac Coherent Light Source, where we aim to measure femtosecond dynamics in materials at atomic resolutions – probing time and length scales in materials that could not be accessed experimentally until now.

Selected Publications

  • S.O. Hruszkewycz, M.V. Holt, J. Maser, C.E. Murray, M.J. Highland, C.M. Folkman, P.H. Fuoss. Coherent Bragg nanodiffraction at the Hard X-ray Nanoprobe beamline, Philosophical Transactions A, accepted June 2013.

  • S.O. Hruszkewycz, M.J. Highland, M.V. Holt, D. Kim, C.M. Folkman, C. Thompson, A. Tripathi, G.B. Stephenson, S. Hong, P.H. Fuoss. Imaging local polarization in ferroelectric thin films by coherent x-ray Bragg projection ptychography, Physical Review Letters, 110, 177601 (2013). [article link]. Press highlights: CNM, Nanowerk

  • S.O. Hruszkewycz, M. Sutton, P. H. Fuoss, B. Adams, S. Rosenkranz, K. F. Ludwig, W. Roseker, D. Fritz, M. Cammarata, D. Zhu, S. H. Lee, H. Lemke, C. Gutt, A. Robert, G. Gruebel, G. B. Stephenson. High contrast x-ray speckle from atomic-scale ordering in liquids and glasses. Physical Review Letters, 109, 185502 (2012). [article link, with supplemental].  Press highlights: ANL, SLAC
  • S.O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, P. H. Fuoss. Quantitative imaging of lattice distortions in epitaxial semiconductor heterostructures using x-ray Bragg projection ptychography. Nano Letters, 12, (10), 5148, (2012). [article link, with supplemental].  Press highlights: Phys.org, Imaging & Microscopy, R&D, CNM
  • S.O. Hruszkewycz, C.M. Folkman, M.J. Highland, M.V. Holt, S.H. Baek, S.K. Streiffer, P. Baldo, C.B. Eom, P.H. Fuoss. X-ray nanodiffraction of tilted domains in a poled epitaxial BiFeO3 thin film. Applied Physics Letters, 99, 232903 (2011). [article link]
  • S.O. Hruszkewycz, M.V. Holt, A. Tripathi, J. Maser, P.H. Fuoss. Framework for three-dimensional coherent diffraction imaging by focused beam x-ray Bragg ptychography. Optics Letters, 36, 2227 (2011). [article link]
  • S.O. Hruszkewycz, R. Harder, X. Xiao, P. H. Fuoss. The effect of exit beam phase aberrations on parallel beam coherent x-ray reconstructions. Review of Scientific Instruments, 81, 123706 (2010). [article link]

Invited Research Talks