Edith Perret received her degree in materials science in 2006 from ETH Zurich, Switzerland. During her doctoral studies (2006-2010), she investigated the structure of molecular liquids under nanometer confinement by synchrotron x-ray reflectivity and surface force experiments at the Swiss Light Source (SLS) of the Paul Scherrer Institute in Switzerland. Prof. J. Friso van der Veen and Prof. Manfred Heuberger supervised her. In autumn 2010 she worked as a scientist at the EMPA St.Gallen in Switzerland. Her project consisted of analyzing small-angle x-ray scattering data of core-sheath polymer fibers. Since March 2011, she is a postdoctoral researcher at Argonne National Laboratory. Her two current projects are focusing on in-situ x-ray and electrochemical studies of solid oxide fuel cells and in-situ measurements of surface species on semiconducting nitrides (GaN and InN) using x-ray diffraction, fluorescence, infrared spectroscopy and metal organic vapor deposition methods.
E. Perret, F. Reifler, R. Hufenus, O. Bunk, M. Heuberger. Modified crystallization in PET/PPS bi-component fibers revealed by Small-Angle and Wide-Angle X-ray Scattering. Macromolecules, DOI 10.1021/ma3021213, 2012. [article link]
E. Perret, C. Park, D. D. Fong, K.-C. Chang, B. J. Ingram, J. A. Eastman, P. M. Baldo, P. H. Fuoss. Resonant X-ray scattering studies of epitaxial complex oxide thin films. Journal of Applied Crystallography, (in print, accepted November 20, 2012).
E. Perret. Structure of molecular liquids under nanometer confinement. Doctoral Thesis ETH Zurich, 2010. [article link]
E. Perret, K. Nygård, D. K. Satapathy, T. E. Balmer, O. Bunk, M. Heuberger and J. F. van der Veen. X-ray reflectivity theory for determining the density profile of a liquid under nanometre confinement. Journal of Synchrotron Radiation, 17:465-472, 2010. [article link]
E. Perret, K. Nygård, D. K. Satapathy, T. E. Balmer, O. Bunk, M. Heuberger and J. F. van der Veen. Molecular liquid under nanometre confinement: density profiles underlying oscillatory forces. Journal of Physics: Condensed matters, 22(23):235102, 2010. [article link]
E. Perret, T. E. Balmer and M. Heuberger. Self-consistent algorithm for calibrating spectrometers to picometer accuracy over the entire wavelength range. Applied Spectroscopy, 64(10):1139-1144, 2010. [article link]