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Materials Science Division |
Igor V. VeryovkinChemist
Materials Science
Division; Bldg. 200 phone: 630-252-3586 Research Interests
Dr.
Veryovkin is an author of more than 60 peer reviewed research papers. His
research interests include (1)
interactions of energetic particles (ions, electrons and photons)
with matter, (2)
physics and chemistry of atomic clusters, (3)
elemental and isotopic abundances in the solar system and stellar nucleosynthesis, (4)
trace analysis and mass spectrometry on nanometer scale, (5)
charged particle optics, (6)
experimental data processing / mining, (7)
virtual reality simulations and development of analytical
instrumentation. Work Experience
Special Bureau for Design and
Technology at Arifov Institute of Electronics, Academy of Sciences of Uzbek
Soviet Socialist Republic, Tashkent, USSR Research Activity: Ion sputtering and Secondary Ion Mass
Spectrometry (SIMS), unimolecular fragmentation
of sputtered cluster ions, ion formation in sputtering phenomena,
development of novel SIMS instrumentationo
Engineer, 1985-1988 o
Engineer-technologist of the 3rd category, 1988-1990 o
Junior (Assistant) Scientist, 1990-1994 o
Scientist, 1994-1995 o
Senior Scientist, 1995-2001 (on sabbatical leave from 1997) Research Activity: Cluster ion emission and secondary ion
formation in ion sputtering,
polyatomic ion bombardment and associated non-additive ion emission
phenomena, quantitative SIMS analysis with dual beams, improvement of
resolving power of SIMS instrumentation by deconvolution
methods o
Visiting Scientist, 1997-1998 o
Visiting Scholar, 1998-2000 o
Visiting Scientist, 2000-2001 o
Assistant Chemist, 2001-2006 o
Chemist, 2006-present Education
M. Sc. in Physical Engineering (physical electronics), 1985, summa cum laude degreeDepartment of Physical Engineering, Thesis: Unimolecular decay of secondary cluster ions of
heavy metals (Advisor: Dr. A. D. Bekkerman) Arifov
Institute of Electronics / Thesis: Investigation of energetic and temporal
characteristics of fragmentation of secondary cluster ions of tantalum (Advisor:
Dr. N. Kh. Dzhemilev) Recent Publications (2004-2008)
62. Efficient multiple beam ion optics for
quantitative surface analysis: from simulations to a fully operational
instrument", Veryovkin I. V.,
Tripa C. E., Pellin M.
J., Physics Procedia,
1 (2008).379-389 (invited) 61. Laser-Driven
Acoustic Desorption of Organic Molecules from
Back-Irradiated Solid Foils", Zinovev, A.V., Veryovkin,
I.V., 60. Development
of a cesium sputter ion source compatible with commercial SIMS
instruments", Belykh, S. F.; Palitsin, V. V.; Veryovkin,
I. V.; Kovarsky, A. P.; Chang, R. J. H.; Adriaens, A., Dowsett M., Adams,
F.; Review of Scientific Instruments,
78, 085101 (2007) 9 pages 59. Mass
Spectrometry on the Nanoscale with Ion Sputtering
based Techniques: what is feasible", Veryovkin I. V., Calaway W. F., Tripa C. E., Pellin M. J., Nuclear Instruments & Methods In
Physics Research Section B-Beam Interactions With Materials And Atoms 2007,
Vol. 261 (2007) Issues 1-2, 508-511 58. Detection
of In-Situ Derivatized Peptides in Microbial Biofilms by Laser Desorption
7.87 eV Postionizaton
Mass Spectrometry", P. D. Edirisinghe, J. F. Moore, K. A. Skinner-Nemec, C. Lindberg, C. S. Giometti,
I. V. Veryovkin, J. E. Hunt, M. J. Pellin, L.
Hanley, Analytical Chemistry,
Vol. 79 (2) (2007), 508-514 57. Extending quantitative mass spectrometry to the nanoscale", Pellin, M.
J.; Veryovkin, I. V.; Calaway,
W. F., Izvestiya Rossiiskoi Akademii Nauk, Seriya Fizicheskaya Vol.
70, (6), (2006), 859-861. 56. Vacuum Ultraviolet Postionization
of Aromatic Groups Covalently Bound to Peptides", Edirisinghe,
P. D.; Moore, J. F.; Calaway, W. F.; Veryovkin, I. V.; Pellin, M. J.; and Hanley, L.; Analytical Chemistry Vol. 78 (16) (2006) 5876-5883 55. Sputtering of Clusters from
Nickel-Aluminum", King, B. V.; Moore, J. F.; Calaway,
W. F.; Veryovkin, I. V.; Pellin, M. J.; Applied
Surface Science, Vol. 252 (19), 2006, 6426-6428 54. 7.87 eV Postionization of Derivatized
Peptides", Hanley, L.; Edirisinghe, P. D.; Calaway, W. F.; Veryovkin,
I. V.; Pellin, M. J.; Moore, J. F.; Applied Surface Science, Vol. 252
(19), 2006, 6723-6726 53. Cesium Sputter Ion Source Compatible with
Commercial SIMS Instruments", Belykh, S. F.;
Palitsin V. V.; Veryovkin, I. V.; Kovarsky A. P.;
Chang R. J. H.; Adriaens, A.; Dowsett,
M.; Adams, F.; Applied Surface
Science, Vol. 252 (19), 2006, 7321-7325 52. Laser Postionization
Secondary Neutral Mass Spectrometry for Analysis on the
Nanometer-Scale"; Veryovkin I.
V.; W.F. Calaway, C.E.
Tripa and M.J. Pellin; in: Technical
Proceedings of the 2006 NSTI Nanotechnology
Conference and Trade Show, Nanotech
2006, Boston, Massachusetts, May 7-11 2006, Volume 1, Chapter 8:
Characterization, 733-736 51. Laser-driven acoustic waves in back-irradiated
thin solid foils"; Zinovev, A. V.; Moore, J.
F.; Calaway, W. F.; Pellin,
M. J.; Veryovkin, I. V.; in: Proceedings of SPIE-The
International Society for Optical Engineering (2006),
6101 (Laser Beam Control and Applications), 480-489.
50. Laser
post-ionization secondary neutral mass spectrometry for ultra-trace analysis
of samples from space return missions"; Veryovkin, IV; Calaway, WF; Tripa, CE; Moore, JF; Wucher, A; Pellin, MJ; Nuclear
Instruments & Methods In Physics Research Section B-Beam Interactions
With Materials And Atoms, 241 (1-4) (2005) 356-360 49. Photocatalytic
degradation of methylene blue on nanocrystalline TiO2:
Surface mass spectrometry of reaction intermediates"; Gnaser, H; Savina, MR; Calaway, WF; Tripa, CE; Veryovkin,
IV; Pellin, MJ; International Journal Of Mass
Spectrometry, 245 (1-3) (2005) 61-67 48. Temperature
dependence of secondary ion emission from tantalum produced by atomic and
polyatomic gold projectiles"; Belykh,
SF; Veryovkin, IV; Palitsin, VV; Samartsev, AV; Adriaens, A;
Adams, F; International Journal Of
Mass Spectrometry, 237 (1) (2004) 55-63 47. On the
trends in kinetic energies of secondary ions produced by polyatomic ion
bombardment"; Veryovkin, IV; Belykh,
SF; Adriaens, A; Zinovev,
AV; Adams, F; Applied Surface Science,
231 (2004) 101-105 46. A new horizon in secondary neutral mass
spectrometry: post-ionization using a VUV free
electron laser"; Veryovkin, IV;
Calaway, WF; Moore, JF; Pellin, MJ; Lewellen, JW; Li, YL; Milton, SV; King, BV; Petravic, M ;
Applied Surface Science, 231
(2004) 962-966 45. Sputtering with polyatomic ions: revisiting
kinetic energy distributions of secondary ions"; Veryovkin, IV; Belykh, SF; Adriaens, A; Adams, F; Nuclear Instruments & Methods In Physics Research Section
B-Beam Interactions With Materials And Atoms, 219 (2004) 215-220 44. A new time-of-flight instrument for quantitative
surface analysis"; Veryovkin,
IV; Calaway, WF;
Moore, JF; Pellin, MJ; Burnett, DS; Nuclear Instruments & Methods In Physics Research Section
B-Beam Interactions With Materials And Atoms, 219 (2004) 473-479 43. Calculating time-of-flight spectra of post-ionized
sputtered neutrals"; Veryovkin,
IV; Calaway, WF; Pellin, MJ; Nuclear Instruments & Methods In
Physics Research Section B-Beam Interactions With Materials And Atoms,
219 (2004) 1051-1057 42. Computer simulation of time-of-flight mass
spectrometers: calculations of mass spectra and spatial distributions of
ions"; Veryovkin, IV;
Chen, CY; Calaway, WF; Pellin, MJ; Lee, T; Nuclear Instruments & Methods In
Physics Research Section A-Accelerators Spectrometers Detectors And
Associated Equipment, 519 (1-2) (2004) 345-352 41. Ion optics of a new time-of-flight mass
spectrometer for quantitative surface analysis"; Veryovkin, IV; Calaway, WF; Pellin, MJ; Nuclear
Instruments & Methods In Physics Research Section A-Accelerators
Spectrometers Detectors And Associated Equipment, 519 (1-2) (2004)
353-362 40. A virtual reality instrument: near-future
perspective of computer simulations of ion optics"; Veryovkin, IV; Calaway, WF; Pellin, MJ; Nuclear Instruments & Methods In
Physics Research Section A-Accelerators Spectrometers Detectors And
Associated Equipment, 519 (1-2): (2004) 363-372 |
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